MOPC04
ANL, Lemont, Illinois, USA
The Instrumentation Development, Evaluation & Analysis Beamline (IDEA Beamline) will characterize the performance of the state-of-the-art X-ray optics and devices planned for the Advanced Photon Source Upgrade (APS-U). The expected two orders of magnitude increase in brightness along with the increased power density due to the circular aspect ratio of the X-ray beam produced by the Multi-bend Achromat (MBA) magnetic lattice in the upgraded storage ring will set new demanding performance requirements on optical components. The upgrade offers a coherent source that many beamlines will utilize for proposed experimental studies, and it is essential that the chosen optics preserve the coherence of the X-ray beam from undulator to sample. The scientific goal of the IDEA Beamline is to obtain performance metrics for proposed beamline optics and components for the APS-U to ensure the best performance of both the planned featured beamlines and the enhanced beamlines. Questions being explored at the IDEA beamline are wavefront and coherence preservation, monochromator stability, optics surface quality, and effects of high heat loads on optical components. One of the objectives is to directly map monochromator vibration and crystal surface roughness to wavefront degradation. Currently the APS-U does not have a suitable testing location for X-ray optics and components that provides the necessary flux or brightness to simulate the planned APS-U source. The IDEA beamline fills this gap. Measurements will simulate the expected MBA upgraded operating conditions for the tested systems and the data obtained will be used to validate, optimize, or re-engineer for best possible performance.
ANL, Lemont, Illinois, USA
The X-ray Photon Correlation Spectroscopy (XPCS) beamline at the Advanced Photon Source (APS) has been selected as one of the nine feature beamlines being de-signed to take advantage of the increase in coherent flux provided by the APS Upgrade. The 8-ID-E enclosure at the beamline will have a dedicated instrument for per-forming Wide Angle XPCS (WA-XPCS) measurements across a range of length and time scales. The instrument will feature a high-stability 6-circle diffractometer, a moveable Long Distance Detector Positioner (LDDP) for positioning a large pixel array detector, and a removable flight path assembly. For intermediate sample to detector distances of 1.5 to 2 meters, a large pixel array detector will be positioned on the diffractometer detector arm. For longer sample to detector distances up to 4 meters, an horizontal scattering geometry will be utilized based on the LDDP to position a second large pixel array detector. The LDDP will consist of a large granite base on which sits a combination of motorized stages. The base will sit on air casters that allow the LDDP to be coarsely posi-tioned manually within the enclosure. Final positioning of the detector will be achieved with the mounted stages. The spatial relationship between the sample and the free moving LDDP will be monitored using a laser tracking system. A moveable flight path will be supported by the diffractometer arm and a mobile floor support to mini-mize air scattering while using the LDDP. The WA-XPCS instrument has been designed with users and beamline staff in mind and will allow them to efficiently utilize the highly enhanced coherent beam provided by the APS Upgrade.
