Author: Olea, G.
Paper Title Page
TUPB08 High-Precision Synchrotron Kappa Diffractometer 163
  • G. Olea, N. Huber, J. Zeeb
    HUBER Diffraktiontechnik GmbH&Co.KG, Rimsting, Germany
  A new research product aiming to work in a 3th generation synchrotron facility (PAL/PLS II) has been developed. Based on increased energy X-ray synchrotron radiation tool and well-known Kappa geometry device principle, the product is expected that will investigate atomic and molecular structures of materials at nanoscale level using several X-ray diffraction techniques. The Kappa diffractometer (K-Dm) machine is maintaining the common structural principle of its family, but working with an extreme precision and load, which is far of the competition. The main body is consisting from customized Kappa goniometer (KGm) device with vertical axis of rotation for high-precision sample (cryostat) manipulation, versatile detector arm (Da) for manipulating in horizontal plan different detectors (optics, slits, etc.) after X-ray beam is scattered and stable alignment base (Ab) for roughly adjusting the product around the X-ray beam. In addition, a XYZ cryo-carrier inside of the KGm is included for fine (submicron) sample adjustments. The kinematic, design and precision concepts applied, together with the obtained test results are all in detail presented.*
* HUBER Diffraction and Positioning GmbH&Co.KG,
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About • paper received ※ 16 July 2021       paper accepted ※ 16 October 2021       issue date ※ 28 October 2021  
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