Author: Wiljes, P.
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Ultra-Precision Mechanics for Fourth-Generation Sources  
  • R. Doehrmann, S. Botta, P. Wiljes
    DESY, Hamburg, Germany
  Fourth-generation synchrotrons, with their extremely good beam conditions, offer experimental possibilities that go far beyond the current technological state of the art. These extremely brilliant x-ray sources enable, among other things with new focusing optics, focal sizes in the nanometer range with the highest intensity and thus allow for highly dynamic experiments also on this scale. In order to guarantee the required beam quality all the way down to the experiment, optimal conditions must be generated for the end stations and for the beamline optics. An optimum of stability and precision can unfortunately only be achieved if, on the one hand, the infrastructure that shields the experiments and enables undisrupted operation is planned very carefully. On the other hand, the scientific instruments must also be optimized and improved. Our strategy for the construction of the PETRA IV experiments is based on five pillars (low vibration, stable environment, rigid construction, optimized design and fast feedback). In this contribution, we describe these concepts in more detail. Furthermore, we present illustrative examples of a possible implementation at PETRA IV.  
slides icon Slides TUOB03 [2.654 MB]  
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Spider - A Mobile Test-Platform for 3D Scanning With Nanometer-Foci  
  • P. Wiljes
    DESY, Hamburg, Germany
  During the past years multiple experiments were designed and built at facilities world wide to do 3D tomography scans on the low nanometer scale. At this resolution effects like vibrations, thermal drifts and manufacturing tolerances become more and more critical even when state of the art components are used. In preparation of the PETRA IV upgrade at DESY, a test device will be designed and used both in the lab as well as at the beamlines to develop and test alignment routines for nano-optics and the sample environment. To keep track on positions and vibration levels during experiments, metrology like interferometers are foreseen within the device.  
poster icon Poster TUPB10 [0.974 MB]  
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