Author: Winarski, R.
Paper Title Page
Instrumentation Development, Evaluation & Analysis (IDEA) Beamline for the APS-U  
  • M.G. Frith, T. Graber, D. Haeffner, M.J. Highland, M. Ramanathan, O.A. Schmidt, R. Winarski
    ANL, Lemont, Illinois, USA
  Funding: Used resources of the Advanced Photon Source, a U.S. DOE Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357.
The Instrumentation Development, Evaluation & Analysis Beamline (IDEA Beamline) will characterize the performance of the state-of-the-art X-ray optics and devices planned for the Advanced Photon Source Upgrade (APS-U). The expected two orders of magnitude increase in brightness along with the increased power density due to the circular aspect ratio of the X-ray beam produced by the Multi-bend Achromat (MBA) magnetic lattice in the upgraded storage ring will set new demanding performance requirements on optical components. The upgrade offers a coherent source that many beamlines will utilize for proposed experimental studies, and it is essential that the chosen optics preserve the coherence of the X-ray beam from undulator to sample. The scientific goal of the IDEA Beamline is to obtain performance metrics for proposed beamline optics and components for the APS-U to ensure the best performance of both the planned featured beamlines and the enhanced beamlines. Questions being explored at the IDEA beamline are wavefront and coherence preservation, monochromator stability, optics surface quality, and effects of high heat loads on optical components. One of the objectives is to directly map monochromator vibration and crystal surface roughness to wavefront degradation. Currently the APS-U does not have a suitable testing location for X-ray optics and components that provides the necessary flux or brightness to simulate the planned APS-U source. The IDEA beamline fills this gap. Measurements will simulate the expected MBA upgraded operating conditions for the tested systems and the data obtained will be used to validate, optimize, or re-engineer for best possible performance.
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